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Ieee-wrtlt.org lookup results from http://whois.jprs.jp server:
- Domain created: 2010-06-20T12:46:47Z
- Domain updated: 2025-04-29T17:10:10Z
- Domain expires: 2026-06-20T12:46:47Z 0 Years, 192 Days left
- Website age: 15 Years, 173 Days
- Registrar Domain ID: REDACTED
- Registrar Url: https://jprs.jp/registrar/
- Registrar WHOIS Server: http://whois.jprs.jp
- Registrar Abuse Contact Email: [email protected]
- Registrar Abuse Contact Phone: +81.352158457
- Name server:
- ns1.dns.ne.jp
- ns2.dns.ne.jp
Administrator
- role : Japan Network Information Center
- address : Uchikanda OS Bldg 4F, 2-12-6 Uchi-Kanda,Chiyoda-ku, Tokyo 101-0047, Japan
- country : JP
- phone : +81-3-5297-2311
- fax : +81-3-5297-2312
- email : [email protected]
- admin-c : JI13-AP
- tech-c : JE53-AP
- handle : JNIC1-AP
- mnt-by : MAINT-JPNIC
- last-modified : 2022-01-05T03:04:02Z
- source : APNIC
Technical support
- role : Japan Network Information Center
- address : Uchikanda OS Bldg 4F, 2-12-6 Uchi-Kanda,Chiyoda-ku, Tokyo 101-0047, Japan
- country : JP
- phone : +81-3-5297-2311
- fax : +81-3-5297-2312
- email : [email protected]
- admin-c : JI13-AP
- tech-c : JE53-AP
- handle : JNIC1-AP
- mnt-by : MAINT-JPNIC
- last-modified : 2022-01-05T03:04:02Z
- source : APNIC
Network
- inetnum : 219.94.128.0 - 219.94.255.255
- name : SAKURA-OSAKA
- remarks : Email address for spam or abuse complaints : [email protected]
- country : JP
- mnt-by : MAINT-JPNIC
- mnt-lower : MAINT-JPNIC
- mnt-irt : IRT-JPNIC-JP
- status : ALLOCATED PORTABLE
- last-modified : 2024-10-01T00:06:35Z
- source : APNIC
Owner
- organization : SAKURA Internet Inc.
- address : GRAND GREEN OSAKA North, JAM BASE 3F, 6-38 Ofukacho, Kita-ku, Osaka-shi, Osaka 530-0011, Japan
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Host Informations
- IP address: 219.94.129.239
- Location: Osaka Japan
- Latitude: 34.6848
- Longitude: 135.5142
- Timezone: Asia/Tokyo
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Websites Listing
We found Websites Listing below when search with ieee-wrtlt.org on Search Engine
Registration – 22nd Workshop on RTL and High Level Testing
WEB Online workshop registration fees include access to workshop sessions and digest of papers. The attendee for both of WRTLT and ATS can register with discount registration …
Ieee-wrtlt.orgSusanta Chakraborty | IEEE Xplore Author Details
WEB He has served as the publicity Co-Chair for the 18th International Conference on VLSI Design in 2005 and the Fifteenth Asian test Symposium, December (ATS), India, in …
Ieeexplore.ieee.orgKuen-Jong Lee | IEEE Xplore Author Details
WEB He served as the General/Program Chair/Co-Chair for several professional events, including the IEEE Asian Test Symposium, VLSI Design, Automation, Test Symposium, WRTLT, …
Ieeexplore.ieee.orgKazuhiko Iwasaki | IEEE Xplore Author Details
WEB He was a Program Co-Chair of the IEEE Pacific Rim International Symposium on Dependable Computing in 2000, a Program Chair of the IEEE Workshop on RTL and …
Ieeexplore.ieee.orgIEEE Xplore
WEB IEEE Xplore, delivering full text access to the world's highest quality technical literature in engineering and technology. | IEEE Xplore
Ieeexplore.ieee.orgSatyadev Ahlawat | IEEE Xplore Author Details
WEB Affiliations: [Dept. of EE, IIT, Jammu, India]. Author Bio: Satyadev Ahlawat received the M.Sc. degree in electronic science from Kurukshetra University, Kuruks
Ieeexplore.ieee.orgSeiji Kajihara | IEEE Xplore Author Details
WEB His research interests include logic testing and dependable systems. He is a member of the IPSJ and fellow of the IEICE. He received the Young Engineer Award from IEICE, in …
Ieeexplore.ieee.org(PDF) Enhancement of test environment generation for …
WEB Nov 1, 2008 · PDF | IEEE WRTLT'08 Best Paper Award Abstract — In this paper, we consider the problem of test environment generation for functional register-transfer... | …
Researchgate.netIEEE Microwave and Wireless Technology Letters - MTT-S
WEB The IEEE Microwave and Wireless Technology Letters (MWTL) (formerly IEEE Microwave and Wireless Components Letters (MWCL)) is published monthly with the purpose of …
Mtt.org(PDF) An Approach to Non-Scan Design for Delay Fault
WEB Nov 1, 2003 · PDF | IEEE WRTLT'03 Best Paper Award | Find, read and cite all the research you need on ResearchGate Conference Paper PDF Available An Approach to …
Researchgate.netVirendra Singh – IIT Bombay
WEB Venkat Rajesh, Erik Larsson, MS Gaur, and Virendra Singh, "An Even Odd DFD Technique for Scan Chain Diagnosis" in IEEE WRTLT, Hong Kong, Nov. 2009. Suraj Sindia, …
Ee.iitb.ac.inPower-Aware Testing – IEEE TTTC
WEB Power-Aware Test Data Compression. Fault Diagnosis and Silicon Debug of Low-Power Designs. Test of Multi-Voltage Designs. Test of Gated-Clock Designs. Test of Power …
Ieee-tttc.orgpublication list - GitHub Pages
WEB 2018. Satyadev Ahlawat, Jaynarayan Tudu, Anzhela Matrosova, Virendra Singh, "A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test", IEEE …
Jayresearch.github.ioPublications - CADSL | EE | IITB
WEB Binod Kumar, Ankit Jindal, Jaynarayan Tudu, and Virendra Singh, `A methodology for post silicon debug utilizing progressive random access scan architecture`, 17 th IEEE …
Ee.iitb.ac.inLogic gates on IEEE Technology Navigator
WEB Logic gates. 2023 IEEE International Symposium on Circuits and Systems (ISCAS) 2022 IEEE 52nd International Symposium on Multiple-Valued Logic (ISMVL) 2021 IEEE Asia …
Technav.ieee.orgTesting on IEEE Technology Navigator
WEB Tutorial: Reliability Testing and Design for Reliability of Packaging Interconnects. Application of Thrifty Test Equipment for EMC Testing. Standards Education: Strategic …
Technav.ieee.org
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